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Электронный каталог: Bublik, V. T. - Estimation of Parameters of Microdefects in Silicon Wafers at their Heat Treatment Using by X-ray...
Bublik, V. T. - Estimation of Parameters of Microdefects in Silicon Wafers at their Heat Treatment Using by X-ray...
Книга (аналит. описание)
Автор: Bublik, V. T.
Perspective technologies, materials and equipments of solid-state electronic components: Estimation of Parameters of Microdefects in Silicon Wafers at their Heat Treatment Using by X-ray...
б.г.
ISBN отсутствует
Автор: Bublik, V. T.
Perspective technologies, materials and equipments of solid-state electronic components: Estimation of Parameters of Microdefects in Silicon Wafers at their Heat Treatment Using by X-ray...
б.г.
ISBN отсутствует
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Книга (аналит. описание)
Bublik, V. T.
Estimation of Parameters of Microdefects in Silicon Wafers at their Heat Treatment Using by X-ray Diffuse Scattering Method (Know-How) / V. T. Bublik, K. D. Shcherbachev // Perspective technologies, materials and equipments of solid-state electronic components : proc. of II russian-japanese seminar (6 April, 2004. Moscow) / ed. L. V. Kozhitov . – M. : MISA Publ., 2004 . – P. 455 .
Bublik, V. T.
Estimation of Parameters of Microdefects in Silicon Wafers at their Heat Treatment Using by X-ray Diffuse Scattering Method (Know-How) / V. T. Bublik, K. D. Shcherbachev // Perspective technologies, materials and equipments of solid-state electronic components : proc. of II russian-japanese seminar (6 April, 2004. Moscow) / ed. L. V. Kozhitov . – M. : MISA Publ., 2004 . – P. 455 .
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Книга
Perspective technologies, materials and equipments of solid-state electronic components: proc. of II russian-japanese seminar (6 April, 2004. Moscow)
MISA Publ., 2004 г.
ISBN 5-87623-132-0
Библиотека МИСиС : Научный
Perspective technologies, materials and equipments of solid-state electronic components: proc. of II russian-japanese seminar (6 April, 2004. Moscow)
MISA Publ., 2004 г.
ISBN 5-87623-132-0
Библиотека МИСиС : Научный