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Электронный каталог: Shcherbachev, K. D. - Procedure of Research of Radiation Damage in Ion Doped Layers of Semiconductor Materials
Shcherbachev, K. D. - Procedure of Research of Radiation Damage in Ion Doped Layers of Semiconductor Materials
Книга (аналит. описание)
Автор: Shcherbachev, K. D.
Perspective technologies, materials and equipments of solid-state electronic components: Procedure of Research of Radiation Damage in Ion Doped Layers of Semiconductor Materials
б.г.
ISBN отсутствует
Автор: Shcherbachev, K. D.
Perspective technologies, materials and equipments of solid-state electronic components: Procedure of Research of Radiation Damage in Ion Doped Layers of Semiconductor Materials
б.г.
ISBN отсутствует
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Книга (аналит. описание)
Shcherbachev, K. D.
Procedure of Research of Radiation Damage in Ion Doped Layers of Semiconductor Materials / K. D. Shcherbachev, V. T. Bublik // Perspective technologies, materials and equipments of solid-state electronic components : proc. of II russian-japanese seminar (6 April, 2004. Moscow) / ed. L. V. Kozhitov . – M. : MISA Publ., 2004 . – P. 462 .
Shcherbachev, K. D.
Procedure of Research of Radiation Damage in Ion Doped Layers of Semiconductor Materials / K. D. Shcherbachev, V. T. Bublik // Perspective technologies, materials and equipments of solid-state electronic components : proc. of II russian-japanese seminar (6 April, 2004. Moscow) / ed. L. V. Kozhitov . – M. : MISA Publ., 2004 . – P. 462 .
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Книга
Perspective technologies, materials and equipments of solid-state electronic components: proc. of II russian-japanese seminar (6 April, 2004. Moscow)
MISA Publ., 2004 г.
ISBN 5-87623-132-0
Библиотека МИСИС : Научный
Perspective technologies, materials and equipments of solid-state electronic components: proc. of II russian-japanese seminar (6 April, 2004. Moscow)
MISA Publ., 2004 г.
ISBN 5-87623-132-0
Библиотека МИСИС : Научный