Электронный каталог библиотеки МИСИС

Книга (аналит. описание)

Gorjunov, N. N.
The Device of a New Generation for Measurement of Specific Electric Resistance of Silicon Monocrystals by a Four Probe Method / N. N. Gorjunov, S. P. Kobeleva // Perspective technologies, materials and equipments of solid-state electronic components : proc. of II russian-japanese seminar (6 April, 2004. Moscow) / ed. L. V. Kozhitov . – M. : MISA Publ., 2004 . – P. 463-464 .