Электронный каталог -Yu, X. - Combined CL/EBIC/DLTS investigation of a regular dislocation network formed by Si wafer direct bo...- Absopac

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Электронный каталог: Yu, X. - Combined CL/EBIC/DLTS investigation of a regular dislocation network formed by Si wafer direct bo...

Yu, X. - Combined CL/EBIC/DLTS investigation of a regular dislocation network formed by Si wafer direct bo...

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Автор: Yu, X.
Физика и техника полупроводников: Combined CL/EBIC/DLTS investigation of a regular dislocation network formed by Si wafer direct bo...
б.г.
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Статья

Yu, X.
Combined CL/EBIC/DLTS investigation of a regular dislocation network formed by Si wafer direct bonding / X. Yu, O. Vyvenko, M. Kitter, W. Seifert, T. Michedlidze, T. Arguirov, M. Reiche // Физика и техника полупроводников . – 2007 . – Т. 41, N 4 . – P. 471-474 .